The radiation hardness assurance facility at INFN-LNS catania for the irradiation of electronic components in air

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dc.authorid0000-0002-0116-1506en_US
dc.authorid0000-0002-9004-735Xen_US
dc.authorid0000-0001-5733-9281en_US
dc.authorid0000-0003-1570-0344en_US
dc.contributor.authorMenichelli, Mauro
dc.contributor.authorAlpat, Behçet
dc.contributor.authorPapi, Andrea
dc.contributor.authorSorensen, Reno Harboe
dc.contributor.authorCirrone, Giuseppe Antonio Pablo
dc.contributor.authorDenizli, Haluk
dc.date.accessioned2021-06-23T19:26:53Z
dc.date.available2021-06-23T19:26:53Z
dc.date.issued2010
dc.departmentBAİBÜ, Fen Edebiyat Fakültesi, Fizik Bölümüen_US
dc.description10th European Conference on Radiation and Its Effects on Components and Systems (RADECS - 09) -- SEP 14-18, 2009 -- Bruges, BELGIUMen_US
dc.description.abstractThis paper describes the beam flux monitoring system that has been developed at the Superconducting Cyclotron at INFN-LNS (Istituto Nazionale di Fisica Nucleare, Laboratori Nazionali del Sud, Catania, Italy) in order to monitor the beam parameters such as energy, flux, beam profile, for SEE (Single Event Effects) cross-sections determination and DD (Displacement Damage) studies. In order to have an accurate and continuous monitoring of beam parameters we have developed fully automatic dosimetry setup to be used during SEE (with heavy ions) and DD (with protons up to 60 MeV) tests of electronic devices and systems. The final goal of our activity is to demonstrate that the operation of such a system in air is not detrimental to the accuracy on controlling the beam profile, energy and fluence delivered onto the DUT (Device Under Test) surface, even with non relativistic heavy ions. We have tested our beam monitoring system with the "Reference SEU monitor" developed by ESA/ESTEC, the results are discussed here.en_US
dc.identifier.doi10.1109/TNS.2010.2049582
dc.identifier.endpage2078en_US
dc.identifier.issn0018-9499
dc.identifier.issue4en_US
dc.identifier.scopus2-s2.0-77955839034en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.startpage2074en_US
dc.identifier.urihttps://doi.org/10.1109/TNS.2010.2049582
dc.identifier.urihttps://hdl.handle.net/20.500.12491/6680
dc.identifier.volume57en_US
dc.identifier.wosWOS:000283074500047en_US
dc.identifier.wosqualityQ1en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.institutionauthorDenizli, Haluk
dc.language.isoenen_US
dc.publisherIeee-Inst Electrical Electronics Engineers Incen_US
dc.relation.ispartofIeee Transactions On Nuclear Scienceen_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectDosimetryen_US
dc.subjectHeavy Ion Acceleratorsen_US
dc.subjectRadiation Effectsen_US
dc.subjectRadiation Testsen_US
dc.titleThe radiation hardness assurance facility at INFN-LNS catania for the irradiation of electronic components in airen_US
dc.typeConference Objecten_US

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