Effect of annealing time and temperature on microstructural and superconducting properties of (Bi,Pb)-2212 thin films produced by magnetron reactive sputtering

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dc.authorid0000-0002-5177-3703en_US
dc.authorid0000-0001-7066-1566
dc.contributor.authorYıldırım, Gürcan
dc.contributor.authorBal, Sevgi
dc.contributor.authorVarilci, Ahmet
dc.date.accessioned2021-06-23T19:29:18Z
dc.date.available2021-06-23T19:29:18Z
dc.date.issued2012
dc.departmentBAİBÜ, Fen Edebiyat Fakültesi, Fizik Bölümüen_US
dc.description.abstractThis study deals with the role of various annealing time (1 h, 2 h, 4 h, 6 h and 8 h) and temperature (840 and 850 degrees C) on the microstructural and superconducting properties of thin films with the aid of scanning electron microscopy (SEM), X-Ray analysis (XRD), electron dispersive X-Ray (EDX), resistivity and transport critical current density (J(c)) measurements. The T-c, J(c), variation of transition temperatures, hole-carrier concentration, grain size, phase purity, lattice parameter, surface morphology, element distribution, crystallinity and resistivity (at room temperature) values of the films prepared are compared with each other. Critical transition temperatures (T-c) of the samples are deduced from the dc resistivity measurement while critical current density values are estimated from the critical current and total cross-sectional area values. It is found that maximum T-c of 79.7 K and Jc of 1520 A/cm(2) are observed for the film annealed at 840 degrees C for 6 h as against 54.9 K and 30 A/cm(2) (minimum values), respectively, for the film annealed at 840 degrees C for 4 h. Moreover, SEM images indicate that the former has the best crystallinity, grain connectivity and largest grain size. Based on these results, T-c and J(c) values of the samples studied are found to depend strongly on the microstructure. Additionally, EDX results show that the elements used for the preparation of all the samples are observed to distribute homogeneously. As for the XRD results, all the samples exhibit the polycrystalline superconducting phase with the changing intensity of diffraction lines. According to the refinement of cell parameters done by considering the structural modulation, the largest lattice parameter a and c are obtained for the film annealed at 840 degrees C for 8 h. To sum up, the aim of the present study is not only to investigate the changes of microstructural and superconducting properties of the samples fabricated in the varied time and temperature but to determine the best ambient for the film fabrication and show the feasibility of obtaining Bi-2212 film with tailored structure, as well.en_US
dc.identifier.doi10.1007/s10948-012-1496-2
dc.identifier.endpage1663en_US
dc.identifier.issn1557-1939
dc.identifier.issn1557-1947
dc.identifier.issue6en_US
dc.identifier.scopus2-s2.0-84864626854en_US
dc.identifier.scopusqualityQ3en_US
dc.identifier.startpage1655en_US
dc.identifier.urihttps://doi.org/10.1007/s10948-012-1496-2
dc.identifier.urihttps://hdl.handle.net/20.500.12491/7152
dc.identifier.volume25en_US
dc.identifier.wosWOS:000309157100005en_US
dc.identifier.wosqualityQ4en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.institutionauthorYıldırım, Gürcan
dc.institutionauthorBal, Sevgi
dc.institutionauthorVarilci, Ahmet
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.relation.ispartofJournal Of Superconductivity And Novel Magnetismen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectBi-2212 Thin Filmen_US
dc.subjectT-cen_US
dc.subjectJ(c)en_US
dc.subjectXRDen_US
dc.subjectSEMen_US
dc.subjectEDXen_US
dc.titleEffect of annealing time and temperature on microstructural and superconducting properties of (Bi,Pb)-2212 thin films produced by magnetron reactive sputteringen_US
dc.typeArticleen_US

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