Corn processing by pulsed electric fields with respect to microbial inactivation and improvement of seed vigour

Basit Öğe Kaydı
dc.contributor.authorEvrendilek, Gulsun Akdemir
dc.contributor.authorAtmaca, Bahar
dc.contributor.authorUzuner, Sibel
dc.date.accessioned2024-09-25T19:59:52Z
dc.date.available2024-09-25T19:59:52Z
dc.date.issued2024
dc.departmentAbant İzzet Baysal Üniversitesien_US
dc.description.abstractPulsed electric field (PEF) treatment of corn grains to improve seed vigour and inactivation of endogenous microflora by energies ranging from 1.20 to 28.8 J were applied to determine effectiveness of applied energies on germination rate (GR), normal seedling rate (NSR), electrical conductivity (EC), ability to germinate under salt (100- and 200 mM salt) and cold (at 10 degrees C for 7 days and at 25 degrees C for 5 days) stresses. Moreover, the effect of PEF treatments was further investigated for the inactivation of total aerobic mesophilic bacteria (TAMB), total mold and yeast (TMY), and inactivation rate (%) of Aspergillus parasiticus. Increased energy provided 11.10 % increase in GR, 21.22 % increase in NSR, 95.50 % increase in germination at 10 degrees C for 7 days. Germination under stress conditions revealed 32.53 %, 68.35 %, and 76 % increase in germination at 25 degrees C for 5 days, under 100 mM- and 200 mM NaCI salt stresses. Inactivation on the mean initial TAMB and TMY were approximately 9.25 and 7.93 log, respectively, with 63.33 +/- 0.22 % reduction in A. parasiticus culture. PEF treated corn seedlings had stronger and taller body formation with stronger roots. The most optimal processing parameters were detected as 300 Hz, 28.80 J, and 19.78 sec. PEF treatment carries a high potential to improve corn vigour with inactivation of surface microflora.en_US
dc.description.sponsorshipTUBITAK [217O068]en_US
dc.description.sponsorshipThe financial support is provided by TUBITAK (Project no: 217O068) .en_US
dc.identifier.doi10.1016/j.compag.2024.108830
dc.identifier.issn0168-1699
dc.identifier.issn1872-7107
dc.identifier.scopus2-s2.0-85187795281en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.urihttps://doi.org/10.1016/j.compag.2024.108830
dc.identifier.urihttps://hdl.handle.net/20.500.12491/13964
dc.identifier.volume219en_US
dc.identifier.wosWOS:001206920700001en_US
dc.identifier.wosqualityN/Aen_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.language.isoenen_US
dc.publisherElsevier Sci Ltden_US
dc.relation.ispartofComputers And Electronics in Agricultureen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.snmzYK_20240925en_US
dc.subjectPulsed electric fieldsen_US
dc.subjectCornen_US
dc.subjectCorn vigouren_US
dc.subjectStress toleranceen_US
dc.subjectMicrobial inactivationen_US
dc.titleCorn processing by pulsed electric fields with respect to microbial inactivation and improvement of seed vigouren_US
dc.typeArticleen_US

Dosyalar

Koleksiyon

WoS İndeksli Yayınlar Koleksiyonu
Scopus İndeksli Yayınlar Koleksiyonu