The effect of ag diffusion on properties of YBa2CU3O7-x thin films produced by electron beam deposition techniques

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dc.authorid0000-0003-4121-9343en_US
dc.authorid0000-0002-2969-0039
dc.authorid0000-0002-3944-0367
dc.authorid0000-0001-7066-1566
dc.contributor.authorGörür, Osman
dc.contributor.authorKüçükömeroğlu, Tayfur
dc.contributor.authorTerzioğlu, Cabir
dc.contributor.authorVarilci, Ahmet
dc.contributor.authorAltunbaş, Mustafa
dc.date.accessioned2021-06-23T19:18:36Z
dc.date.available2021-06-23T19:18:36Z
dc.date.issued2005
dc.departmentBAİBÜ, Fen Edebiyat Fakültesi, Fizik Bölümüen_US
dc.description.abstractSuperconducting YBa2Cu3O7-x thin films were prepared on pure MgO and Ag/MgO substrates (without and with Ag buffer layer) using an electron beam evaporation technique. The effects of isothermal annealing temperature and Ag diffusion on the crystalline structure and some superconducting properties were investigated by X-ray diffraction, scanning electron microscopy, critical temperature, critical current density and room temperature resistivity measurements. The optimum annealing conditions causing a high degree of preferential orientation with the c-axis perpendicular to the substrates were found to be the isothermal annealing at 930 degreesC for 5 h. Annealing of films on Ag/MgO substrates is accompanied by Ag diffusion from the buffer layer into YBCO films. The higher rate of crystallization of the YBCO films, the higher degree of c-axis orientation, the higher dense surface morphology, the increased lattice parameter c (by approximate to0.1%), the reduced room temperature resistivity (2-3 times), the slightly enchanced critical temperature (T-c = 92 K at R = 0) and the critical current density (J(c) = 4.2 x 10(5) A/cm(2) at 77 K) were observed for the Ag-doped films (on Ag/MgO substrates) in comparison with those for the undoped films (on MgO substrates). The temperature dependence of the Ag diffusion coefficient in YBCO films in the range 600-800 degreesC was described by the relation D = 1.9 X 10(-6) exp(-0.73 eV/kT).en_US
dc.identifier.doi10.1016/j.physc.2004.11.003
dc.identifier.endpage42en_US
dc.identifier.issn0921-4534
dc.identifier.issn1873-2143
dc.identifier.issue1-2en_US
dc.identifier.scopus2-s2.0-10844249124en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.startpage35en_US
dc.identifier.urihttps://doi.org/10.1016/j.physc.2004.11.003
dc.identifier.urihttps://hdl.handle.net/20.500.12491/5767
dc.identifier.volume418en_US
dc.identifier.wosWOS:000226313800006en_US
dc.identifier.wosqualityQ3en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.institutionauthorTerzioğlu, Cabir
dc.institutionauthorVarilci, Ahmet
dc.language.isoenen_US
dc.publisherElsevier Science Bven_US
dc.relation.ispartofPhysica C-Superconductivity And Its Applicationsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectYBCO Thin Filmen_US
dc.subjectAg-diffusionen_US
dc.subjectGrain Orientationen_US
dc.titleThe effect of ag diffusion on properties of YBa2CU3O7-x thin films produced by electron beam deposition techniquesen_US
dc.typeArticleen_US

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