Low-field behavior of Ti-added MgB2/Cu superconducting wires

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dc.authorid0000-0003-3183-7017en_US
dc.authorid0000-0001-5159-7191en_US
dc.authorid0000-0002-9124-3862
dc.authorid0000-0002-0069-0238
dc.authorid0000-0001-7630-3938
dc.contributor.authorGençer, Ali
dc.contributor.authorKılıç, Ahmet
dc.contributor.authorGüçlü, Nusret
dc.contributor.authorÖzyüzer, Lütfi
dc.contributor.authorBelenli, İbrahim
dc.date.accessioned2021-06-23T19:18:23Z
dc.date.available2021-06-23T19:18:23Z
dc.date.issued2005
dc.departmentBAİBÜ, Fen Edebiyat Fakültesi, Fizik Bölümüen_US
dc.description2004 Applied Superconductivity Conference -- OCT 03-08, 2004 -- Jacksonville, FLen_US
dc.description.abstractWe report on low-field magnetic properties of Ti-added (0-20 wt. % of Ti) Cu-clad MgB2 superconducting wires. Wires were produced by mixing appropriate amount of Ti and reacted MgB2 powder which was then placed inside Cu tubes with a diameter of 6 mm. The tubes were then cold worked by rolling or drawing to smaller diameters and then annealed at various temperatures to enhance the grain connectivity. XRD studies show that Ti addition results in new but minor phases. We have then measured ac susceptibilities in the temperature range between 20 K and 40 K in ac fields of 20-1600 A/m. The data show that an additional loss mechanism is established with Ti-addition. The calculated ac losses are increasing with increasing Ti-content in the main superconducting matrix.en_US
dc.identifier.doi10.1109/TASC.2005.848897
dc.identifier.endpage3355en_US
dc.identifier.issn1051-8223
dc.identifier.issn1558-2515
dc.identifier.issue2en_US
dc.identifier.scopus2-s2.0-22144489842en_US
dc.identifier.scopusqualityQ2en_US
dc.identifier.startpage3352en_US
dc.identifier.urihttps://doi.org/10.1109/TASC.2005.848897
dc.identifier.urihttps://hdl.handle.net/20.500.12491/5714
dc.identifier.volume15en_US
dc.identifier.wosWOS:000229767200234en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.institutionauthorBelenli, İbrahim
dc.language.isoenen_US
dc.publisherIeee-Inst Electrical Electronics Engineers Incen_US
dc.relation.ispartofIeee Transactions On Applied Superconductivityen_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectAC Susceptibilityen_US
dc.subjectCritical Current Density J(c)en_US
dc.subjectGranularityen_US
dc.subjectMgB2/Cu Wireen_US
dc.titleLow-field behavior of Ti-added MgB2/Cu superconducting wiresen_US
dc.typeConference Objecten_US

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