Characterization of CdZnTe thin films prepared by magnetron sputtering from a single CdZnTe target

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dc.authorid0000-0002-6652-4662
dc.authorid0000-0002-2612-8972
dc.authorid0000-0003-2239-295X
dc.contributor.authorYılmaz, Ercan
dc.contributor.authorTuran, Raşit
dc.contributor.authorAktağ, Aliekber
dc.contributor.authorAkgöl, Ali
dc.date.accessioned2021-06-23T18:56:35Z
dc.date.available2021-06-23T18:56:35Z
dc.date.issued2011
dc.departmentBAİBÜ, Fen Edebiyat Fakültesi, Fizik Bölümüen_US
dc.description37th IEEE Photovoltaic Specialists Conference, PVSC 2011 -- 19 June 2011 through 24 June 2011 -- Seattle, WA -- 89752en_US
dc.description.abstractWe utilized a sputtering technique by using a single Cadmium Zinc Tellurium (CdZnTe) target to form alloys of 200 nm Cd 1-xZn xTe thin films onto heated (200-300-400°C) and unheated glass substrates for all 0 < x < 1 range. The films then were annealed at 150-300-450°C under the N 2 ambient. Measurements were performed before and after annealing by XRD, XPS, FTIR spectroscopes. The XRD studies revealed that heated Cd 1-xZn xTe films present a cubic oriented (111), (220) and (311) polycrystalline structure, whereas unheated films are largely amorphous. The XPS results under UHV were support the XRD measurements. FTIR analysis indicated that the increasing of deposition temperature increases absorption intensity. Depending on preparation conditions and heat treatment, the optical band gap calculations of respective films were obtained in the range of 1.46-1.95 eV. Results illustrate that Cd 1-xZn xTe thin film sputtered at 400°C and annealed at 450°C under the N 2 ambient displays a demanding behavior.en_US
dc.identifier.doi10.1109/PVSC.2011.6186216
dc.identifier.endpage1394en_US
dc.identifier.isbn9781424499656
dc.identifier.issn0160-8371
dc.identifier.scopus2-s2.0-84861021568en_US
dc.identifier.scopusqualityN/Aen_US
dc.identifier.startpage1390en_US
dc.identifier.urihttps://doi.org/10.1109/PVSC.2011.6186216
dc.identifier.urihttps://hdl.handle.net/20.500.12491/5035
dc.indekslendigikaynakScopusen_US
dc.institutionauthorYılmaz, Ercan
dc.institutionauthorAktağ, Aliekber
dc.language.isoenen_US
dc.relation.ispartofConference Record of the IEEE Photovoltaic Specialists Conferenceen_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectAnnealingen_US
dc.subjectZinc
dc.subjectSputtering
dc.subjectOptical films
dc.subjectPhotonic Band Gap
dc.subjectX-ray Scattering
dc.titleCharacterization of CdZnTe thin films prepared by magnetron sputtering from a single CdZnTe targeten_US
dc.typeConference Objecten_US

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