Effects of substrate temperature on the microstructure and morphology of CdZnTe thin films

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dc.authorid0000-0001-8152-9122en_US
dc.contributor.authorMalkaş, Hasan
dc.contributor.authorKaya, Şenol
dc.contributor.authorYılmaz, Ercan
dc.date.accessioned2021-06-23T19:35:24Z
dc.date.available2021-06-23T19:35:24Z
dc.date.issued2014
dc.departmentBAİBÜ, Fen Edebiyat Fakültesi, Fizik Bölümüen_US
dc.description.abstractThe effects of substrate temperature on the microstructure and morphology of CdZnTe thin films were investigated in detail. The CdZnTe thin films were deposited on glass substrates at 200A degrees C, 300A degrees C and 400A degrees C by radio frequency magnetron sputtering and annealed at 450A degrees C for an hour under N-2 ambient at atmospheric pressure. The microstructure and morphology of the CdZnTe films were analyzed by using x-ray diffractometry, scanning electron microscopy, energy dispersive x-ray spectroscopy and atomic force microscopy. The effects of substrate temperature on transmission spectra of the CdZnTe films were also investigated. The experimental results show that the optimum morphology and crystalline thin film structures were achieved at 400A degrees C growth temperature. At higher substrate temperatures, atomic mobility and diffusion are promoted, which can stabilize the uniformity and crystallite size. The crystalline grains enlarge and the surface morphology becomes smoother due to growth of grains in the CdZnTe thin films. In addition, the transmission spectra of the films are consistent with the morphological changes. It may be concluded that substrate temperature in growing CdZnTe films has a substantial effect on morphological characteristics, and desired quality of the CdZnTe thin films may be fabricated at higher substrate temperatures.en_US
dc.identifier.doi10.1007/s11664-014-3371-3
dc.identifier.endpage4017en_US
dc.identifier.issn0361-5235
dc.identifier.issn1543-186X
dc.identifier.issue11en_US
dc.identifier.scopus2-s2.0-84907682722en_US
dc.identifier.scopusqualityQ3en_US
dc.identifier.startpage4011en_US
dc.identifier.urihttps://doi.org/10.1007/s11664-014-3371-3
dc.identifier.urihttps://hdl.handle.net/20.500.12491/7781
dc.identifier.volume43en_US
dc.identifier.wosWOS:000342494800018en_US
dc.identifier.wosqualityQ2en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.institutionauthorKaya, Şenol
dc.institutionauthorYılmaz, Ercan
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.relation.ispartofJournal Of Electronic Materialsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectSurface Morphologyen_US
dc.subjectSubstrate Temperatureen_US
dc.subjectCdZnTe Thin Filmsen_US
dc.subjectAFMen_US
dc.subjectXRDen_US
dc.titleEffects of substrate temperature on the microstructure and morphology of CdZnTe thin filmsen_US
dc.typeArticleen_US

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