Two-to-four coherent beams interference patterns of non-orthogonal planes

dc.contributor.authorAktağ, Aliekber
dc.date.accessioned2021-06-23T18:40:29Z
dc.date.available2021-06-23T18:40:29Z
dc.date.issued2008
dc.departmentBAİBÜ, Fen Edebiyat Fakültesi, Fizik Bölümüen_US
dc.description.abstractIn this paper, we present an analysis of intensity distribution of interference pattern of two-to-four linearly polarized plane waves at their intersection in a plane surface. A configuration in which the four plane waves intersect at different angles along four non-orthogonal planes is considered. We show that the shape and the intensity distribution of the interference pattern is strong function of the angles of planes, kinds of polarizations, beam incidence angles. A variety of two-dimensional intensity distribution arrays have been formed by two-to-four beams with differing plane angles, angles of beam incidence and beam polarizations, which may potentially be useful in forming arrays of submicron structures in thin films. We also give a few experimental examples in Co-Pt and Co/SiOx multilayer thin films.en_US
dc.identifier.endpage143en_US
dc.identifier.issn1300-0101
dc.identifier.issn1303-6122
dc.identifier.issue3en_US
dc.identifier.scopus2-s2.0-45849105581en_US
dc.identifier.scopusqualityQ3en_US
dc.identifier.startpage139en_US
dc.identifier.trdizinid77605en_US
dc.identifier.urihttps://app.trdizin.gov.tr/makale/TnpjMk1EVTE
dc.identifier.urihttps://hdl.handle.net/20.500.12491/3124
dc.identifier.volume32en_US
dc.indekslendigikaynakScopusen_US
dc.indekslendigikaynakTR-Dizinen_US
dc.institutionauthorAktağ, Aliekber
dc.language.isoenen_US
dc.relation.ispartofTurkish Journal of Physicsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.subjectLasersen_US
dc.subjectİnterference Patterning
dc.subjectArrays
dc.subjectMultilayers
dc.subjectThin Films
dc.titleTwo-to-four coherent beams interference patterns of non-orthogonal planesen_US
dc.typeArticleen_US

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