Surface morphology and depth profile study of Cd1-xZnxTe alloy nanostructures

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dc.authorid0000-0001-9542-5121en_US
dc.contributor.authorYılmaz, Ercan
dc.contributor.authorTugay, Evrin
dc.contributor.authorAktağ, Aliekber
dc.contributor.authorYıldız, İlker
dc.contributor.authorParlak, Mehmet
dc.contributor.authorTuran, Raşit
dc.date.accessioned2021-06-23T19:28:46Z
dc.date.available2021-06-23T19:28:46Z
dc.date.issued2012
dc.departmentBAİBÜ, Fen Edebiyat Fakültesi, Fizik Bölümüen_US
dc.description.abstractCd1-xZnxTe thin films with thickness of 200 nm were deposited on glass substrates from a single sputtering target. During the deposition process, the substrates were heated at 400 degrees C and deposited films were subjected to an annealing process at 300 and 450 degrees C for an hour under flowing N-2 gas at atmospheric pressure. Influence of in situ heating and post-deposition annealing treatments on the structural and optical evolution of Cd1-xZnxTe nanostructures were investigated by diagnostic techniques such as X-ray diffraction (XRD), energy dispersive spectroscopy (EDS), scanning electron microscopy (SEM), atomic force microscopy (AFM). X-ray photoelectron spectroscopy (XPS), and UV-transmission spectroscopy. The transmission spectra in the region of the optical absorption band edge were measured for as-deposited and heat-treated of CdZnTe samples. Band gap of the deposited films were found to be in the range of 1.59-1.66 eV. The XRD studies revealed that heated Cd1-xZnxTe films have a cubic oriented (111), (220) and (311) polycrystalline structure whereas unheated films are mostly amorphous. The effects of annealing temperature on the composition of the thin films were discussed. XPS measurements were performed in the depth profiling mode in order to understand the variation in the chemical composition of the films. Results were compared with the structural analysis obtained from the XRD measurements. (C) 2012 Elsevier B.V. All rights reserved.en_US
dc.identifier.doi10.1016/j.jallcom.2012.08.028
dc.identifier.endpage98en_US
dc.identifier.issn0925-8388
dc.identifier.scopus2-s2.0-84866054042en_US
dc.identifier.scopusqualityQ1en_US
dc.identifier.startpage90en_US
dc.identifier.urihttps://doi.org/10.1016/j.jallcom.2012.08.028
dc.identifier.urihttps://hdl.handle.net/20.500.12491/7064
dc.identifier.volume545en_US
dc.identifier.wosWOS:000310818700017en_US
dc.identifier.wosqualityQ1en_US
dc.indekslendigikaynakWeb of Scienceen_US
dc.indekslendigikaynakScopusen_US
dc.institutionauthorYılmaz, Ercan
dc.institutionauthorAktağ, Aliekber
dc.language.isoenen_US
dc.publisherElsevier Science Saen_US
dc.relation.ispartofJournal Of Alloys And Compoundsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectCdZnTeen_US
dc.subjectSputteringen_US
dc.subjectXRDen_US
dc.subjectXPSen_US
dc.subjectEDSen_US
dc.subjectSEMen_US
dc.subjectAFMen_US
dc.titleSurface morphology and depth profile study of Cd1-xZnxTe alloy nanostructuresen_US
dc.typeArticleen_US

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